Analysis of Coupling Phenomena Between an Arbitrarily Shaped Conductor and Thick Wall Apertures
| Year: | 1996 | |||
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| Type of Publication: | In Proceedings | |||
| Authors: |
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| Book title: | Proceedings of the International Symposium on Electromagnetic Compatibility (EMC 96) | |||
| Pages: | 363–367 | |||
| Month: | September | |||
| Note: | Rome, Italy |
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